New Technologies for Probing High Performance, Low Power Circuits
As designs for mobile devices and computers use lower power circuits in their design, validation testing and debug become more challenging. Board and component density increase leaving little space for probing. In addition, loading from oscilloscope probes can become a critical issue impacting system operation. Lastly, low power devices transmit low amplitude signals making the low noise performance of the probe and oscilloscope very important.

If you are a Silicon Validation Engineer or Hardware Engineer testing components and systems, this webinar will help you identify the challenges of probing low power components and help you approach your testing more successfully.
November 5th at 11am Singapore time
Duration: 60 minutes
Language: English
Presenter: Carl Wong – Applications Engineer (Tektronix)
Carl Wong As Regional Applications Engineer, Carl is responsible for a wide range of oscilloscope applications from power conversions to serial bus communications and component test.

Carl was previously a Component Materials Engineer in Keysight Technologies where he worked in the supply chain organization dealing with Keysight's strategic suppliers to ensure the quality and assurance of supply of wide range of RF components.

He graduated from University of Nottingham with First Class Honors Master’s Degree in Electrical & Electronic Engineering.